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AFM Probes, Tips, and Cantilevers – TipsNano

AFM Probes. AFM, Atomic Force Microscope, probes or tips are designed to fit into most commercially available AFMs and outperform all other silicon SPM, Scanning Probe Microscope, probes used in surface analysis.

AFM Probes, Tips, and Cantilevers – TipsNano
Kristiina 15-214
http://tipsnano.com, http://afmnano.com
Tallinn, HA
Estonia

Manufacturer